Introduce Scanning Probe Microscopy into Education

Authors

  • Z. Hájková Institute of Physics, Academy of Sciences of the Czech Republic, Prague
  • A. Fejfar Institute of Physics, Academy of Sciences of the Czech Republic, Prague
  • M. Ledinský Institute of Physics, Academy of Sciences of the Czech Republic, Prague
  • V. Píč Institute of Physics, Academy of Sciences of the Czech Republic, Prague
  • F. Křížek Institute of Physics, Academy of Sciences of the Czech Republic, Prague
  • D. Šulc Brno University of Technology, Brno
  • Z. Nováček Brno University of Technology, Brno
  • P. Wertheimer Brno University of Technology, Brno

Keywords:

scanning probe microscopy, scanning tunnelling microscopy, atomic force microscopy, models, demonstrations, analogies, educational materials

Abstract

Contemporary chemistry, physics, as well as biology frequently deal with the structure of matter at nanoscale level. One of the most important techniques used for ima­ging and measuring surfaces at the nanoscale (sometimes even with atomic resolution) is the scanning probe microscopy (SPM). SPM is an important up-and-coming technique in both academic sphere and industry. For this reason, concepts underlying SPM should be mentioned in secondary education, at least for students with an interest in science and technical subjects. In order to introduce SPM into secondary science education, various teaching approaches might be followed. In this contribution, special attention is paid to simple models and analogies of SPM to illustrate the basic SPM principles.

Published

2016-02-15

How to Cite

Hájková, Z., Fejfar, A., Ledinský, M., Píč, V., Křížek, F., Šulc, D., Nováček, Z., & Wertheimer, P. (2016). Introduce Scanning Probe Microscopy into Education. Chemické Listy, 110(2), 153–159. Retrieved from http://w.chemicke-listy.cz/ojs3/index.php/chemicke-listy/article/view/238

Issue

Section

Articles